Abstract Submitted to the    NANOTUBE'04 Conference:

Since carbon nanotube is a nanoscale material, we need some special tools such as TEM, SPM, Raman, and photoluminescence, etc. to understand the nanostructure. Since TEM is one of the most intuitive tool to observe the nanostructure, it is widely used in lots of scientific studies. Although TEM is a powerful tool, it is not that easy to understand the image especially when there is a overlapping matter such as amorphous carbons films or obstructing tubes. In this presentation, TEM image simulation is used to simulate many situations that could lead to the misinterpretation of the actual TEM image by changing the defocus value. The results are compared with the TEM images that appears to be obtained at the inappropriate defocus conditions.